Digital comparator

Results: 149



#Item
81ADC0831/ADC0832/ADC0834/ADC0838 8-Bit Serial I/O A/D Converters with Multiplexer Options General Description The ADC0831 series are 8-bit successive approximation A/D converters with a serial I/O and configurable input m

ADC0831/ADC0832/ADC0834/ADC0838 8-Bit Serial I/O A/D Converters with Multiplexer Options General Description The ADC0831 series are 8-bit successive approximation A/D converters with a serial I/O and configurable input m

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Source URL: www.rigelcorp.com

Language: English - Date: 2006-07-13 13:20:48
82ADC10154, ADC10158 10-Bit Plus Sign 4 ms ADCs with 4- or 8-Channel MUX, Track/Hold and Reference General Description Features

ADC10154, ADC10158 10-Bit Plus Sign 4 ms ADCs with 4- or 8-Channel MUX, Track/Hold and Reference General Description Features

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Source URL: www.rigelcorp.com

Language: English - Date: 2006-07-13 13:21:08
83MX908 300 in 1 CONTENTS 1) Surprise and Fun

MX908 300 in 1 CONTENTS 1) Surprise and Fun

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Source URL: www.super-science-fair-projects.com

Language: English - Date: 2010-02-20 13:55:38
84The Speedster-EXD – A New Event Driven Hybrid CMOS X-ray Detector! Christopher 1 Griffith ,

The Speedster-EXD – A New Event Driven Hybrid CMOS X-ray Detector! Christopher 1 Griffith ,

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Source URL: files.aas.org

Language: English - Date: 2014-08-15 17:07:24
85[removed]; Rev 5; 9/08  Microprocessor Voltage Monitors with Programmable Voltage Detection ____________________________Features

[removed]; Rev 5; 9/08 Microprocessor Voltage Monitors with Programmable Voltage Detection ____________________________Features

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Source URL: datasheets.maximintegrated.com

Language: English - Date: 2008-09-23 21:02:38
86Circuit Note  CN-0332 Devices Connected/Referenced

Circuit Note CN-0332 Devices Connected/Referenced

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Source URL: www.analog.com

Language: English - Date: 2014-01-23 18:05:34
87Circuit Note  CN-0277 Devices Connected/Referenced Circuits from the Lab® reference designs are engineered and

Circuit Note CN-0277 Devices Connected/Referenced Circuits from the Lab® reference designs are engineered and

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Source URL: www.analog.com

Language: English - Date: 2014-02-13 16:25:59
88Microsoft Word - Using the ADC Exploration Board

Microsoft Word - Using the ADC Exploration Board

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Source URL: www.arrl.org

Language: English - Date: 2011-11-11 15:40:09
89ADC Driver Selection Guide

ADC Driver Selection Guide

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Source URL: www.analog.com

Language: English - Date: 2012-09-21 12:36:32
90DYNAMIC TESTING FOR RADIATION INDUCED FAILURES IN A STANDARD CMOS SUBMICRON TECHNOLOGY PIXEL FRONT-END1 D. De Venuto*, F. Corsi°, member IEEE , M. J. Ohletz^, member IEEE * Dipartimento di Elettrotecnica ed Elettronica

DYNAMIC TESTING FOR RADIATION INDUCED FAILURES IN A STANDARD CMOS SUBMICRON TECHNOLOGY PIXEL FRONT-END1 D. De Venuto*, F. Corsi°, member IEEE , M. J. Ohletz^, member IEEE * Dipartimento di Elettrotecnica ed Elettronica

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Source URL: grouper.ieee.org

Language: English - Date: 1999-10-17 21:34:03